adipose-tissue
发表于 2025-3-25 07:01:31
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无关紧要
发表于 2025-3-25 09:50:39
CMOS Transistor Reliability and Variability Mechanisms,This chapter talks about device reliability mechanisms such as hot electron injection, gate oxide breakdown, negative bias temperature instability and process variation.
方便
发表于 2025-3-25 11:46:10
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flaggy
发表于 2025-3-25 16:20:44
Power Amplifier Reliability,This chapter talks about power amplifier reliability subjected to voltage stress and thermal effect. Both class AB and class E power amplfiiers are discussed. In addition, the class E power amplifier is fabricated using 0.18 micron CMOS process and experimental data of power amplifier performance before and after stress are presented.
必死
发表于 2025-3-25 20:28:42
Voltage-Controlled Oscillator Reliability,This chapter talks about the LC oscillator reliability subjected to electrical stress. Mixed-mode device and circuit simulation results as well as experimental data of voltage-controlled LC oscillators are presented.
钢笔尖
发表于 2025-3-26 04:13:31
Mixer Reliability,This chapter talks about millimeter-wave mixer reliability subjected to electrical stress. Transistor stress data in additional to mixer performance before and after stress are provided.
EVEN
发表于 2025-3-26 08:06:17
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眼界
发表于 2025-3-26 11:36:50
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Emg827
发表于 2025-3-26 14:25:42
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Locale
发表于 2025-3-26 20:18:46
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