令人发腻
发表于 2025-3-23 10:04:47
http://reply.papertrans.cn/20/1920/191905/191905_11.png
同时发生
发表于 2025-3-23 13:56:12
http://image.papertrans.cn/b/image/191905.jpg
装饰
发表于 2025-3-23 20:41:56
https://doi.org/10.1007/978-981-19-8551-5Built-in Fault-tolerance; On-chip Fault-tolerance; Self-test, Self-diagnosis, and Self-repair; Fault-to
连系
发表于 2025-3-23 22:28:44
http://reply.papertrans.cn/20/1920/191905/191905_14.png
友好
发表于 2025-3-24 02:21:36
http://reply.papertrans.cn/20/1920/191905/191905_15.png
治愈
发表于 2025-3-24 07:47:29
erant solution that enables self-test, self-diagnosis and seWith the end of Dennard scaling and Moore’s law, IC chips, especially large-scale ones, now face more reliability challenges, and reliability has become one of the mainstay merits of VLSI designs. In this context, this book presents a built
者变
发表于 2025-3-24 11:47:50
onlyoffers a powerful backbone for various on-chip fault-tolerant designs and implementations, but also has farther-reaching implications such as maintaining graceful performance degradation, mitigating the imp978-981-19-8553-9978-981-19-8551-5
originality
发表于 2025-3-24 18:11:52
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip DesignA Self-Test, Self-Di
下级
发表于 2025-3-24 22:43:29
Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design978-981-19-8551-5
Barter
发表于 2025-3-25 03:13:07
Wahrscheinlichkeitsverteilungen, Usually, it integrates techniques such as fault detection, fault diagnosis, and fault recovery in chip design such that it can work independently without additional offline testing equipments. In this chapter, we will introduce the background of various silicon faults first and then elaborate the g