digestive-tract
发表于 2025-3-21 17:04:06
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爱哭
发表于 2025-3-21 22:15:44
taking precautions in the design of the IC (design for testability), testing on PCB level can be simplified 10 a great extent. This condition has been essential for the success of the introduction of Boundary-Sc,m Test (BST) at board level.978-1-4613-6371-2978-1-4615-3132-6
广告
发表于 2025-3-22 03:11:36
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检查
发表于 2025-3-22 07:29:58
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oblique
发表于 2025-3-22 12:32:14
https://doi.org/10.1007/978-3-540-32753-0m in a following section. By searching the minimum test vector set for memory interconnect tests, it is proven that BST is an excellent tool for these type of tests as well. In the last section an architecture of a Boundary-Scan test flow is given.
水槽
发表于 2025-3-22 13:11:12
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吞下
发表于 2025-3-22 20:55:15
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vasculitis
发表于 2025-3-23 00:08:27
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Ingenuity
发表于 2025-3-23 03:10:09
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野蛮
发表于 2025-3-23 07:44:50
BST Design Languages,can applications in various phases of the product life cycle, where ‘product’ may be defined as IC, PCB or system. Table 4-1 intends to place the various tools in their right context, which may be useful when reading this chapter.