Indurate
发表于 2025-3-28 14:48:00
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Muscularis
发表于 2025-3-28 20:16:58
Process Reliability,ity and the compatibility of fabricating CMOS and bipolar devices on the same chip. Performance and process tradeoffs are expected as these two device types are merged with minimal additional process steps. Therefore, it is imperative that device reliability issues are integrated with the process ar
工作
发表于 2025-3-28 23:13:16
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Engulf
发表于 2025-3-29 03:35:32
BiCMOS Standard Memories,n and area have been regarded as the theoretical indications for technology performance and density. In a similar manner memory access time, memory power dissipation and memory size have been regarded as the practical indications of technology performance and density. Against this empirical yard sti
悲观
发表于 2025-3-29 09:30:12
Testing,tudies have shown that today test can easily account for onethird of development effort but test-escapes still account for 30% of all defective devices removed from printed circuit boards, Fig. 7.1 [.]. With test playing such an important role, it is imperative that the implications of a technology
TIGER
发表于 2025-3-29 13:35:21
Analog Design,grated circuits evolved from the bipolar technologies with vertical . transistors and lateral . transistors. While bipolar analog integrated circuits continued to develop, NMOS technologies were becoming popular in digital integrated circuits for their high packing density. For analog applications,
Bernstein-test
发表于 2025-3-29 15:36:23
CAD Methods for BiCMOS Design, design technology have resulted in increasingly complex designs. Most important of all, the data management of these complex new designs has become difficult. VLSI design is now gated by the available set of software tools. The tools that encompass the entire gamut of design tasks are . software.
牲畜栏
发表于 2025-3-29 23:09:02
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你正派
发表于 2025-3-30 01:25:35
9楼
thrombosis
发表于 2025-3-30 05:59:27
10楼