可耕种
发表于 2025-3-28 17:26:20
Force Feedback for Nanohandling,cess control. With dimensions of the parts to be handled of sometimes considerably less than 100 nm and with a typical positioning accuracy in the nanometer range, nanohandling applications have detached several orders of magnitude from the operators’ macroscopic realm of experience. Powerful sensor
DUST
发表于 2025-3-28 22:20:55
Characterization and Handling of Carbon Nanotubes,45 nm transistors for the year 2007. Using electron beam lithography, structures down to 10 nm are producible. But this will be the absolute lower limit for lithographic structuring, so that new materials have to be developed for a further miniaturization of structures.
GLARE
发表于 2025-3-28 23:45:30
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strain
发表于 2025-3-29 05:51:02
Material Nanotesting,etration of a body with a known geometry into the material’s surface. Both the force (or load) necessary for this penetration and the depth of indentation have to be measured, either separately or simultaneously.
渗透
发表于 2025-3-29 08:44:16
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有发明天才
发表于 2025-3-29 12:14:41
1860-5168 mber of R&D groups and companies all over the world. Controlled, reproducible assembly processes on the nanoscale will enable high-throughput manufacturing of revolutionary products and open up ne978-1-84628-978-1Series ISSN 1860-5168 Series E-ISSN 2196-1735
PATHY
发表于 2025-3-29 16:44:51
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