LINES
发表于 2025-4-1 01:54:04
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MIR
发表于 2025-4-1 07:49:31
Nanometer-Scale Four-Point Probe Resistance Measurements of Individual Nanowires by Four-Tip STM,tudies with two different samples, Co-silicide nanowires self-assembled on Si(110) surface and Cu nanowires made by damascene processes used in LSI industry. It is shown that the four-tip STM with CNT tips is versatile and powerful for measuring the conductivity of individual nanostructures.