Feigned
发表于 2025-3-23 13:15:58
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Ingenuity
发表于 2025-3-23 17:27:31
,Diskursanalyse und Kritik – Einleitung,ablish the validity of the technique, little work has been done to obtain new information. In this chapter we will review some of this work. We assume that the reader has no prior knowledge of this technique and we will therefore review the theory of EXAFS, the methods of data analysis, and the experimental technique.
Communal
发表于 2025-3-23 18:10:27
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puzzle
发表于 2025-3-24 00:26:24
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虚假
发表于 2025-3-24 04:05:01
Diskursanalyse und feministische Kritik(en)ng mode makes the application of electron microscopy especially effective. Although already valuable information on crystal defects can be gained by using the routine technique of diffraction contrast imaging. which has a resolution of some10 nm — in the special weak-beam technique. of some nm -, th
地名表
发表于 2025-3-24 07:32:18
https://doi.org/10.1007/978-3-658-02180-1 microscopic investigations which revealed microtopography of surface structures and processes on the same monatomic layer level as the surface-analytical instruments both in the transmission (TEM) and the reflection (REM) modes. Useful accounts on recent surface electron microscopy have been given
噱头
发表于 2025-3-24 13:02:35
0172-5076gained by using the routine technique of diffraction contrast imagingl-3) which has a resolution of some 4 10 nm - in the special weak-beam technique ) of some978-3-642-68733-4978-3-642-68731-0Series ISSN 0172-5076
外星人
发表于 2025-3-24 18:02:11
High-Resolution Electron Microscopy of Crystals,ng mode makes the application of electron microscopy especially effective. Although already valuable information on crystal defects can be gained by using the routine technique of diffraction contrast imaging. which has a resolution of some10 nm — in the special weak-beam technique. of some nm -, th
motor-unit
发表于 2025-3-24 20:26:13
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神圣在玷污
发表于 2025-3-25 02:01:27
High-Resolution Electron Microscopy of Crystals,jor importance. For crystalline materials this connection is related to the lattice structure, and it can be shown convincingly that the material properties depend on deviations from the ideal lattice structure in the majority of cases. For this reason a reliable detection and analysis of defects in