吞食
发表于 2025-3-21 19:28:03
书目名称Analysis and Design of Resilient VLSI Circuits影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0156203<br><br> <br><br>书目名称Analysis and Design of Resilient VLSI Circuits影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0156203<br><br> <br><br>书目名称Analysis and Design of Resilient VLSI Circuits网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0156203<br><br> <br><br>书目名称Analysis and Design of Resilient VLSI Circuits网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0156203<br><br> <br><br>书目名称Analysis and Design of Resilient VLSI Circuits被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0156203<br><br> <br><br>书目名称Analysis and Design of Resilient VLSI Circuits被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0156203<br><br> <br><br>书目名称Analysis and Design of Resilient VLSI Circuits年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0156203<br><br> <br><br>书目名称Analysis and Design of Resilient VLSI Circuits年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0156203<br><br> <br><br>书目名称Analysis and Design of Resilient VLSI Circuits读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0156203<br><br> <br><br>书目名称Analysis and Design of Resilient VLSI Circuits读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0156203<br><br> <br><br>
悦耳
发表于 2025-3-21 21:24:52
978-1-4899-8510-1Springer-Verlag US 2010
circuit
发表于 2025-3-22 02:10:13
Rajesh Garg,Sunil P. KhatriDescribes the state of the art in the areas of radiation tolerance circuit design and process variation tolerant circuit design.Presents analytical approaches to test efficiently the severity of elect
青石板
发表于 2025-3-22 04:50:47
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阻止
发表于 2025-3-22 10:59:47
lytical approaches to test efficiently the severity of electThis monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era
inundate
发表于 2025-3-22 15:00:45
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Radiation
发表于 2025-3-22 20:12:42
Book 2010 it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process
LAY
发表于 2025-3-22 21:38:01
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Ptsd429
发表于 2025-3-23 04:41:34
Analytical Determination of the Radiation-induced Pulse Shape
–DOX
发表于 2025-3-23 06:10:51
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