Preamble
发表于 2025-3-23 13:44:49
Computer-Aided testability analysis for analog circuits for an objective quantification of the test effectiveness. This paper describes how the technique of Inductive Fault Analysis can be used to quantify the test effectiveness on basis of realistic data on manufacturing defects. Experiences with the tool suite developed to support this analysis show t
金丝雀
发表于 2025-3-23 15:19:48
Concepts for bandgap References and voltage measurement systemsics of bipolar transistors, and methods to compensate for this temperature dependence for application in accurate bandgap References. Methods and technologies to calibrate bandgap References are discussed. As case studies, two types of bandgap References are discussed. One of them is implemented in
使迷惑
发表于 2025-3-23 18:41:34
Monolithic Voltage and Current References: Theme and Variations are of moderate to high accuracy, and generally intended for operation in a low-voltage commercial context, which typically means a minimum supply of 2.7V and a minimum temperature of-30°C. In some cases, the supply may be as low as 1.2V and operation may be required at temperatures of-55°C, though
EXPEL
发表于 2025-3-23 23:16:30
Integrated Current and Time Referenceswithout the need for external components, clocking, or trimming. Low temperature-drift current sources can also be realized with this method, which uses MOS threshold and mobility temperature-coefficient cancellation.
欢乐中国
发表于 2025-3-24 02:37:07
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regale
发表于 2025-3-24 09:22:32
Johan H. Huijsing,Rudy J. Plassche,Willy M. C. San
finale
发表于 2025-3-24 13:22:33
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Enthralling
发表于 2025-3-24 16:19:01
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Ablation
发表于 2025-3-24 21:41:56
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BOOM
发表于 2025-3-25 00:47:59
978-1-4419-5157-1Springer Science+Business Media Dordrecht 1996