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发表于 2025-3-21 18:09:55
书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0143649<br><br> <br><br>书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0143649<br><br> <br><br>书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0143649<br><br> <br><br>书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0143649<br><br> <br><br>书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0143649<br><br> <br><br>书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0143649<br><br> <br><br>书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0143649<br><br> <br><br>书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0143649<br><br> <br><br>书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0143649<br><br> <br><br>书目名称Accelerating Test, Validation and Debug of High Speed Serial Interfaces读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0143649<br><br> <br><br>
infatuation
发表于 2025-3-21 21:58:34
Transmitter Jitter Extractions on ATE,gen. Sie tritt mit einer Fülle von Bestimmungen ein, um eine tragfähige Grundlage für die Beziehungen zwischen Arbeitgeber und Arbeitnehmer zu schaffen. Sie greift unter Umständen sogar in den freien Arbeitsvertrag zugunsten des schwächeren Kontrahenten ein und formt die Bedingungen, von denen ein A
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发表于 2025-3-22 01:01:14
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发表于 2025-3-22 04:49:46
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迷住
发表于 2025-3-22 11:06:17
Accelerating Test, Validation and Debug of High Speed Serial Interfaces978-90-481-9398-1
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发表于 2025-3-22 16:41:14
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发表于 2025-3-22 20:31:30
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BILIO
发表于 2025-3-22 21:14:53
Explains statistical measures of confidence and the ways to .High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal
使厌恶
发表于 2025-3-23 01:30:19
https://doi.org/10.1007/978-3-031-40486-3rove accuracy while keep test time short. The advantages and disadvantages of each of the proposed method are discussed, such that the best method can be selected for task at hand. Finally, a set of experiments is undertaken to validate the proposed approaches.
ENDOW
发表于 2025-3-23 09:06:47
https://doi.org/10.1007/978-3-031-40486-3T), pseudorandom noise injection and channel emulation. Then, we provide the details of a complete standalone tester that uses relays and/or MEMS-based switching devices. The advantages and disadvantages of the state-of-the art in each such case are presented.