愤怒历史 发表于 2025-3-23 11:09:17

Submitted on: 20 April 2020.
Revised on: 28 July 2020.
Accepted on: 28 August 2020.

___________________IEEE Journal of the Electron Devices Society

数量 发表于 2025-3-23 17:05:41

http://reply.papertrans.cn/2/119/11825/11825-12.png

LEVY 发表于 2025-3-23 21:46:07

http://reply.papertrans.cn/2/119/11825/11825-13.png

一个搅动不安 发表于 2025-3-24 01:15:10

Submitted on: 10 October 2024.
Revised on: 08 November 2024.
Accepted on: 31 December 2024.

___________________IEEE Journal of the Electron Devices Society

反话 发表于 2025-3-24 03:26:54

Submitted on: 07 September 2004.
Revised on: 30 September 2004.
Accepted on: 10 November 2004.

___________________IEEE Journal of the Electron Devices Society

思想上升 发表于 2025-3-24 09:03:35

http://reply.papertrans.cn/2/119/11825/11825-16.png

空洞 发表于 2025-3-24 13:40:35

Submitted on: 11 June 1999.
Revised on: 14 September 1999.
Accepted on: 26 October 1999.

___________________IEEE Journal of the Electron Devices Society

手段 发表于 2025-3-24 15:55:53

http://reply.papertrans.cn/2/119/11825/11825-18.png

弄皱 发表于 2025-3-24 21:21:22

Submitted on: 23 May 2004.
Revised on: 15 June 2004.
Accepted on: 11 August 2004.

___________________IEEE Journal of the Electron Devices Society

LIMIT 发表于 2025-3-25 01:39:22

Submitted on: 05 October 2016.
Revised on: 17 November 2016.
Accepted on: 11 January 2017.

___________________IEEE Journal of the Electron Devices Society
页: 1 [2] 3 4
查看完整版本: SCIE期刊IEEE Journal of the Electron Devices Society 2024/2025影响因子:2.145 (IEEE J ELECTRON DEVI) (2168-6734). (ENGINEERING