BULK
发表于 2025-3-21 19:10:27
书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK1060362<br><br> <br><br>书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK1060362<br><br> <br><br>书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK1060362<br><br> <br><br>书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK1060362<br><br> <br><br>书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK1060362<br><br> <br><br>书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK1060362<br><br> <br><br>书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK1060362<br><br> <br><br>书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK1060362<br><br> <br><br>书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK1060362<br><br> <br><br>书目名称Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK1060362<br><br> <br><br>
PARA
发表于 2025-3-21 23:20:10
https://doi.org/10.1007/978-3-030-41536-5Variation-Aware Design of Custom Integrated Circuits; Analog Design Centering and Sizing; Analog IC Re
neologism
发表于 2025-3-22 01:34:41
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发表于 2025-3-22 06:06:10
António Manuel Lourenço Canelas,Jorge Manuel CorreDescribes a new yield estimation methodology to reduce the time impact caused by Monte Carlo simulations, enabling its adoption in analog integrated circuits sizing and optimization processes with pop
调味品
发表于 2025-3-22 10:16:12
Book 2020onte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models c
我不重要
发表于 2025-3-22 16:45:15
tegrated circuits sizing and optimization processes with pop.This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The
个阿姨勾引你
发表于 2025-3-22 20:19:55
Book 2020ulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization..
朝圣者
发表于 2025-3-22 21:50:19
on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization..978-3-030-41538-9978-3-030-41536-5
Neuralgia
发表于 2025-3-23 02:51:17
Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
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发表于 2025-3-23 05:45:05
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