complicated 发表于 2025-3-21 17:24:50

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atistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de­ scribes a spectrum of different statistical design problems, such as parametric yield optimization, generaliz978-1-4613-5935-7978-1-4615-2225-6

记忆 发表于 2025-3-22 19:11:54

978-1-4613-5935-7Springer Science+Business Media New York 1995

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查看完整版本: Titlebook: Yield and Variability Optimization of Integrated Circuits; J. C. Zhang,M. A. Styblinski Book 1995 Springer Science+Business Media New York