臆断 发表于 2025-3-25 03:46:58

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Spangle 发表于 2025-3-25 07:38:43

R. Jenkins,J. L. de Vriesking­dom grew. In AD 989-90, soon after the grand prince of Kiev, Vladimir the Great (980-1015), embraced the Byzantine Ortho­dox Christian faith, the Kievan pagan state was forcibly converted to Christianity. From Kiev, the Eastern Orthodox faith spread to the other Russian principalities.

衍生 发表于 2025-3-25 11:44:23

R. Jenkins,J. L. de Vries(whose power on a world scale was now unmatched) had grown. Henceforth, the external relations of the disunited Latin American states would be greatly influenced by the policies of their more united northern neighbor.

Callus 发表于 2025-3-25 16:10:09

Detectors — double plateaux flow proportional counter. A single plateau is found for a sample of pure sulphur, using the S Kα line, but pure samples of iron and chromium are both found to give a second plateau, again when measuring their Kα lines.

男生如果明白 发表于 2025-3-25 22:58:05

Removal of sample fluorescencethe X-ray tube and specimen. A Xe proportional counter is used to record counts on one of the haematite reflections but even though this is one of the strongest reflections usable, the peak to background is only about 1.5 to 1.

Conserve 发表于 2025-3-26 02:54:58

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STELL 发表于 2025-3-26 05:40:37

Extra lines in X-ray diffractometrya .-spacing of 3.08Å, plus many others. A weak, broad line was observed above a rather high background at approximately 6.5°(2θ). It was suspected from the shape of this line that it did not belong to the regular diffraction pattern. Can there be an alternative explanation for this line.

avarice 发表于 2025-3-26 10:49:16

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允许 发表于 2025-3-26 15:15:28

Trace analysis — derivation of detection limit expressionn which defines the lower limit of detection in terms of the analysis time ., the background counting rate .. and the response . of an element given in c/s per%. Remember that trace analysis always requires two measurements, i.e. peak plus background.

天文台 发表于 2025-3-26 17:30:49

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查看完整版本: Titlebook: Worked Examples in X-Ray Analysis; R. Jenkins,J. L. Vries Book 1970 Springer Science+Business Media New York 1970 X-ray.spectrometry